| ||||||||||||||||||||
|
|
||||||||||
|
RESEARCH SUMMARY We have now uncovered many new mechanisms for dissociative chemisorption, desorption and absorption, such as chemistry with a hammer, that are responsible for the different surface chemistries under the different conditions. These mechanisms are the fundamental principles underlying the pressure effect on surface chemistry. Our understanding of them has enabled us to “trick” the surface reactions, which could previously only be observed at ambient conditions, to occur in a UHV environment. In turn, the UHV environment enables the mechanism and intermediates of a surface reaction to be unambiguously identified. For example, the capability of carrying out the ethylene hydrogenation reaction on Ni under UHV conditions has allowed us to demonstrate unequivocally that the hydrogen reactive for hydrogenation is hydrogen buried beneath the surface rather than hydrogen adsorbed on the surface, as depicted in undergraduate chemistry texts. Our group is also interested in the dynamics of a surface chemical reaction. A molecular beam-surface scattering experiment, coupled with optical and electron spectroscopies, enables the angular, energy and mass distributions of product molecules from a surface chemical reaction to be measured. Because the product molecules do not undergo collisions before detection, these distributions are directly related to the detailed dynamics of the last step of the reaction. For example, we have recently observed a new mechanism for dissociative chemisorption called atom abstraction. In this process, the dangling bonds of a Si surface abstract a F atom from an incident F2 molecule while the complementary F atom is scattered back into the gas phase. When XeF2 interacts with Si, as it does when XeF2 is used to etch Si to produce microelectromechanical devices, Si abstracts one F atom. The concomitant product, XeF, is propelled away from the surface, as we observe from our measurements of the XeF translational and vibrational energy, due to exothermicity release. A 100 femtoseconds later, XeF that is sufficiently vibrationally excited dissociates in the gas phase, 2 Å from the transition state, and provides an additional F atom to etch Si. This experiment showed for the first time that gas phase dissociation of a product of a surface chemical reaction is an integral step in the overall chemistry of a molecule-surface interaction. REPRESENTATIVE PUBLICATIONS Catalyzed CO Oxidation at 70 K on an Extended Au/Ni Surface Alloy Dissociation of a Product of a Surface Reaction in the Gas Phase: XeF2 Reaction with Si The Unique Chemistry of Hydrogen Beneath the Surface: Catalytic Hydrogenation of Hydrocarbons Fluorine Atom Abstraction by Si(100): II. Model The Distinctive Reactivities of Surface-Bound H and Bulk H for the Catalytic Hydrogenation of Acetylene A New Mechanism for Dissociative Chemisorption: Atom Abstraction from F2 by Si(100) The Chemistry of Bulk Hydrogen: Reaction of H Embedded in Ni with Adsorbed CH3 Hydrogen Embedded in Ni: Production by Incident Atomic Hydrogen and Detection by High Resolution Electron Energy Loss New Mechanisms for Chemistry at Surfaces Collision Induced Dissociative Chemisorption of CH4 on Ni(111) by Inert Gas Atoms: The Mechanism for Chemistry with a Hammer
|
|||||||||||